Advances in X-Ray Analysis: Volume 26 by Robert L. Snyder (auth.), Camden R. Hubbard, Charles S.

By Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)

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Eindhoven (1965). 5. P. M. DeWolff, J. Taylor and W. Parrish, Experimental Study of Effect of Crystallite Size Statistics on X-Ray Diffractometer Intensities, Journal ~ Phys. 30:63-69 (1959). 6. C. R. Hubbard, H. E. Swanson and F. A. Mauer, A Silicon Powder Diffraction Standard Reference Material, Journal ~ Cryst. 8:45-48 (1975). 7. G. Will, POWLS: A Powder Least-Squares Program, Journal 12:483-485 (1979). 8. G. Will, W. Parrish and T. C. Huang, Crystal Structure Refinement by Profile Fitting and Least Squares Analysis of Powder Diffractometer Data, in preparation.

0 10-20 ~m (311) Fig. 2. Recordings of intensity variations of rotating silicon powder samples of various particle sizes. 41 W. PARRISH AND T. C. HUANG Table 2. , avg. 10 runs. 5 (111) a for each particle size range and the averages of the two runs are listed. The step scanning conditions are in the footnote. The count times were increased for the weaker reflections to obtain a more uniform counting statistical accuracy for the four reflections. The integrated and peak intensities of (400), (311) and (220) are the values relative to (111)= 100 for each set.

From a fully intercepted and scattered primary beam to a partially intercepted and scattered primary beam, two effects will occur. First as the scattering (diffraction) angle gets smaller the intensity will increase. Second, as less of the sample support intercepts the primary beam, the total amount of scatter will get less. The overall effect is to produce a scatter curve with a peak. The actual position of the scatter intensity maximum may vary from sample to sample, but it will typically occur at about 3-4 degrees 20.

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